| 论文编号: | 172511O120100255 |
| 第一作者所在部门: | 二室四组 |
| 论文题目: | 一种基于SOI工艺FPGA的新型边界扫描电路的设计与实现 |
| 论文题目英文: | |
| 作者: | 王剑 |
| 论文出处: | EI收录 |
| 刊物名称: | ICSICT2010 |
| 年: | 2010 |
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| 影响因子: | 0 |
| 摘要: | A novel Boundary-Scan circuit compatible with IEEE 1149.1 standard and designed for our SOI-Based FPGA is presented in this paper. The new Boundary-Scan circuit serves the test of FPGA at the chip as well as board level and the added features facilitate the configuration and verification functions of FPGA. The test results from the fabricated chip demonstrate that this circuit successfully realizes the desired functions in programming, verification and testing. |
| 英文摘要: | |
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| 备注: | ICSICT2010 |
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