论文编号: 172511O120100259
第一作者所在部门: 三室一组
论文题目: 基于Au纳米晶埋层的ZrO2薄膜的自整流阻变存储器的交叉阵列存储应用
论文题目英文:
作者: 刘明
论文出处: EI收录
刊物名称: IEEE INEC
: 2010
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收录类别:
影响因子: 0
摘要: The self-rectifying resistive switching behavior is
investigated in the Au/ZrO2: nc-Au/n+ Si sandwich structure
with the Au nanocrystals embedded ZrO2 films (ZrO2: nc-Au)
fabricated by e-beam evaporation. The rectification ratio is
obtained to be 7×102 under ±0.5 V at low-resistance state (LRS),
which can alleviate the cross talk effect in crossbar structure
arrays without additional switching elements. The different
current conduction mechanisms at LRS are studied.
英文摘要:
外单位作者单位:
备注: IEEE International NanoElectronics Conference