| 论文编号: | 172511O120100269 |
| 第一作者所在部门: | 二室四组 |
| 论文题目: | IEEE1149.1的EXTEST指令应用于多FPGA系统间互联线 |
| 论文题目英文: | |
| 作者: | 王剑 |
| 论文出处: | EI收录 |
| 刊物名称: | MNDSCS2010 |
| 年: | 2010 |
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| 影响因子: | 0 |
| 摘要: | An approach for detecting open and short faults on the interconnect wires of a multi-FPGA system will be presented in this paper. In a multi-FPGA system with N interconnects, this approach can detect whether and where an open fault occurs by executing the IEEE 1149.1 JTAG EXTEST instruction once. If multiple short connections exist, this approach will only detect the first short fault. The test time is thus greatly reduced for finding a single short fault per chip. |
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| 备注: | 2010 International Conference on Micro Nano Devices, |
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