| 论文编号: | 172511O120110045 |
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| 论文题目: | Analysis of Trap Generation during Programming/Erasing Cycling in Silicon Nanocrystal Memory Devices |
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| 刊物名称: | Semiconductor Science and Technology |
| 年: | 2011 |
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| 联系作者: | 刘明 |
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科研产出