| 论文编号: | 172511O120130207 |
| 第一作者所在部门: | |
| 论文题目: | Dependence of Band Alignment and Interfacial Suboxide GeOx Thickness of Thermal GeO2/Ge Stacks on GeO2 Thickness by X-ray Photoelectron Spectroscopy |
| 论文题目英文: | |
| 作者: | 刘洪刚 |
| 论文出处: | |
| 刊物名称: | Extended Abstracts of the 2013 International Conference on Solid State Devices and Materials |
| 年: | 2013-09-27 |
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| 期: | 2013 |
| 页: | 22 |
| 联系作者: | 刘洪刚 |
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| 英文摘要: | |
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科研产出