| 论文编号: | 1725110120150122 |
| 第一作者所在部门: | 高频高压中心 |
| 论文题目: | Low frequency noise measurements as a characterization tool for reliability assessment in AlGaN/GaN high-electron-mobilityTransistors (HEMTs) |
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| 刊物名称: | PEDs2015 |
| 年: | 1949 |
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| 期: | 1 |
| 页: | 1-3 |
| 联系作者: | 赵妙 |
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科研产出