| 论文编号: | 1725110120160279 |
| 第一作者所在部门: | |
| 论文题目: | Failure Analysis of the VDMOS Device with VSD and RDS (on) Exceeded Limit Based on Reliability Physics |
| 论文题目英文: | |
| 作者: | 李庆 |
| 论文出处: | |
| 刊物名称: | Prognostics and System Health Management Conference |
| 年: | 2016 |
| 卷: | |
| 期: | 2 |
| 页: | 12 |
| 联系作者: | 李庆 |
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| 影响因子: | |
| 摘要: | |
| 英文摘要: | |
| 外单位作者单位: | |
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