| 论文编号: | 1725110120160197 |
| 论文题目: | Study of total ionizing dose induced read bit errors in magneto-resistive |
| 作者: | 张浩浩 |
| 刊物名称: | Microelectronics Reliability |
| 年: | 2016 |
| 期: | 67 |
| 页: | 104 |
| 联系作者: | 毕津顺,刘明 |
| 论文编号: | 1725110120160197 |
| 论文题目: | Study of total ionizing dose induced read bit errors in magneto-resistive |
| 作者: | 张浩浩 |
| 刊物名称: | Microelectronics Reliability |
| 年: | 2016 |
| 期: | 67 |
| 页: | 104 |
| 联系作者: | 毕津顺,刘明 |
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