论文编号: | 1725110120160178 |
论文题目: | The Statistics of Set Time of Oxide-based Resistive Switching Memory |
作者: | 张美芸 |
刊物名称: | Physical and Failure Analysis of Integrated Circuits (IPFA), 2016 IEEE 23rd International Symposium on the |
年: | 2016 |
期: | 16287286 |
页: | 1946 |
联系作者: | 龙世兵 |
科研产出