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论文题目	作者	刊物名称	发表年度
A novel mask structure for measuring the defocus of scanner	董立松;	SPIE Advanced Lithography，International Society for Optics and Photonics	2016
String Select Transistor Leakage Suppression By Threshold Voltage Modulation In 3DNAND Flash Memory	邹兴奇;	2016 IEEE 13th International Conference on Solid-State and Integrated Circuit Technology	2016
Design technology co-optimization for N14 Metal1 layer	段英丽;	2016 China Semiconductor Technology International Conference (CSTIC)	2016
Effective solution for the 14nm node multiple patterning lithography	于丽贤;	2016 China Semiconductor Technology International Conference (CSTIC)	2016
Defect engineering for shallow n‐type junctions in germanium: Facts and fiction	Eddy Simoen;	physica status solidi (a)	2016
Performance Enhancement of Metal Floating Gate Memory By Using a Bandgap Engineered High-k Tunneling Barrier	姜丹丹;	ECS Transactions	2016
一种对称式双光栅干涉位移测量系统的研制	高金磊;	中国激光	2016
Schottky Barrier Height Tuning via the Dopant Segregation Technique through Low-Temperature Microwave Annealing	罗军;	Materials	2016
Impact of the Effective Work Function Gate Metal on the Low-Frequency Noise of Gate-All-Around Silicon-on-Insulator NWFETs	方雯;	IEEE Eletrcon Device Letters	2016
Random telegraph noise: the key to single defect studies in nano-devices	Eddy Simoen;	Thin Solid Films	2016
Low-frequency noise spectroscopy of bulk and border traps in nanoscale devices	Eddy Simoen;	Solid state Phenomena	2016
Study Of RBSOA Reliability Of Nanoscale Partially Narrow Mesa IGBT (PNM-IGBT)	陆江;	International Conference on Solid-State and Integrated Circuit Technology (ICSICT)	2016
Failure Analysis of the VDMOS Device with VSD and RDS (on) Exceeded Limit Based on Reliability Physics	李庆;	Prognostics and System Health Management Conference	2016
Bonding Degradation Modeling for High-power Semiconductors	;	第二届国际高压直流会议HVDC	2016
A Simulation Model for the PN Junction Based on SOI	卜建辉;	International Conference on Solid-State and Integrated Circuit Technology	2016